Seminář o metodách blízkého pole 2019
Akce již proběhla - děkujeme Vám za účast
Zde je ke stažení sborník abstraktů.
Program
Registration: Wed, 12:00 – 13:00
Opening: Wed, 13:00 – 13:10
| Wed 13:10 – 13:50 |
Fernando Araujo de Castro |
Towards 3D nanoscale imaging of complex thin films using scanning probe microscopy |
| Wed 13:50 – 14:30 |
Denis Vasyukov |
Introduction to Scanning Microwave Microscopy |
| Wed 14:30 – 14:50 |
Anna Charvátová Campbell |
Nanoindentor tip analysis by AFM |
| Wed 14:50 – 15:10 |
Dušan Novotný |
Měřicí technika Morava s.r.o. company presentation |
| Wed 15:10 – 15:30 |
|
Coffee break |
| Wed 15:30 – 15:50 |
Teodor Gotszalk |
Array of electromagnetically cantilevers for force-distance spectroscopy metrological investigations |
| Wed 15:50 – 16:10 |
Daniel Haško |
Measurement of the elastic properties of soft samples in fluids |
| Wed 16:10 – 16:30 |
Vilma Buršíková |
Characterisation of plasma-polymer organosilicon composite thin films deposited under dusty plasma conditions |
| Wed 16:30 – 16:50 |
Jiří Buršík |
Local mechanical properties of advanced thermoelectrics |
| Wed 16:50 – 17:10 |
Egor Ukraintsev |
Peak Force AFM study of a chiral helicene-based macrocycles assembly on HOPG |
| Wed 17:10 – 17:30 |
David Nečas |
Tip dilation artefacts & roughness measurement – parametric approach |
| Wed 17:30 – 17:50 |
Filip Jakeš |
RMI company presentation |
| Wed 18:00 – 19:00 |
|
Dinner |
| Thu 9:00 – 9:40 |
Volker Neu |
Probing magnetic textures on the nanoscale |
| Thu 9:40 – 10:00 |
Matěj Hývl |
Contact force in C-AFM |
| Thu 10:00 – 10:20 |
Jaroslav Kuliček |
Microscopic surface potential study for understanding ionic migration in perovskites |
| Thu 10:20 – 10:40 |
Dušan Novotný |
Měřicí technika Morava s.r.o. company presentation |
| Thu 10:40 – 11:00 |
|
Coffee break |
| Thu 11:00 – 11:40 |
Yannick De Wilde |
Near-field investigation of plasmonic materials and devices at infrared wavelengths |
| Thu 11:40 – 12:00 |
Petr Klapetek |
FDTD calculations of infrared SNOM probes |
| Thu 12:00 – 12:20 |
Jan Vávra |
Scattering-Type Scanning Near-field Optical Microscopy and Spectroscopy for Nanoscale Chemical Analysis - company presentation |
| Thu 12:30 – 14:50 |
|
Lunch & group photo |
| Thu 14:50 – 15:10 |
Radovan Vraník |
Mechanical response of helicene molecules on Ag(111) substrate to RF pulses
|
| Thu 15:10 – 15:30 |
Mihai-George Mureșan |
AFM measurements of laser-induced damaged sites |
| Thu 15:30 – 15:50 |
Bohuslav Rezek |
Nano-analysis of composition and photovoltaic properties of nanodiamonds with polypyrrole |
| Thu 15:50 – 16:10 |
Łukasz Zarodkiewicz |
MSA System company presentation |
| Thu 16:10 – 16:30 |
|
Coffee break |
| Thu 16:30 – 16:50 |
Ivan Ošťádal |
Cleaning tungsten STM tips for UHV measurements |
| Thu 16:50 – 17:10 |
Pavel Kocan |
Electric field of an STM tip as a tool for probing stability of molecular layers |
| Thu 17:10 – 17:30 |
Jiří Doležal |
Metastability of a copper phthalocyanine molecule on a thin insulating NaCl layer |
| Thu 17:30 – 17:50 |
Taras Chutora |
On-surface synthesis of ethynylene bridged anthracene polymers |
| Thu 17:50 – 18:10 |
Benjamin Mallada |
Atomic-scale study of impact of Boron and Nitrogen dopants in graphene chemical reactivity by STM/AFM/KPFM and DFT calculations. |
| Thu 18:10 – 18:30 |
Zdeněk Nováček |
LiteScope™ AFM-in-SEM: New applications and tools for in-situ sample analysis - company presentation |
| Thu 19:00 – 23:00 |
|
Social evening |
| Fri 9:20 – 9:30 |
Lukáš Fojt |
Characterization of carbon-based electrodes using AFM and Raman spectroscopy techniques |
| Fri 9:30 – 9:50 |
Marek Havlíček |
Polymer spheres calibration for use in particle counters done by AFM |
| Fri 9:50 – 10:10 |
Jan Martinek |
SThM and infrared microscope calibration method |
| Fri 10:10 – 10:30 |
Jan Vaniš |
Characterization of ZnO nanorod heterostructures |
| Fri 10:30 – 10:50 |
Marek Černík |
alpha300Ri Inverted 3D Confocal Raman Microscopy - company presentation |
| Fri 10:50 – 11:10 |
|
Coffee break |
| Fri 11:10 – 11:30 |
Dušan Hemzal |
Noble metal nanoparticles as template for successful characterization of biomolecules |
| Fri 11:30 – 11:50 |
Jan Přibyl |
AFM based spectroscopy for nanomechanical mapping of living cells, biomolecules and biomaterials |
| Fri 11:50 – 12:10 |
Tomáš Finsterle |
Microscopic study change of adhesion after drug exposure on surface coating with diamond and gold nanoparticles |
| Fri 12:10 – 12:30 |
Dušan Novotný |
Měřicí technika Morava s.r.o. company presentation |
| Fri 12:30 |
|
End of the workshop, lunch |
Témata
- Nové režimy SPM, pokročilé techniky (mechanické, termální, magnetické, elektrické a optické vlastnosti)
- UHV STM a AFM, aplikace SPM v nanotechnologiích
- Aplikace SPM metod v biologii
- Vývoj SPM zařízení a související metrologie
- Zpracování SPM dat
Seznam zvaných přednášejících:
- Fernando Araujo de Castro, National Physical Laboratory, Velká Británie
- Volker Neu, IFW Dresden, Německo
- Yannick De Wilde, ESPCI, Francie
- Denis Vasyukov, METAS, Švýcarsko
Séverine GOMES, INSA Lyon, Francie
Sponzoři a vystavovatelé
- MT-M (hlavní sponzor), reprezentující firmu Bruker, SPECS, JPK Instruments a související firmy
- NenoVision
- Uni-Export Instruments, reprezentující firmu Witec
- RMI, reprezentující NT-MDT a související firmy
- Nicolet CZ, reprezentující firmu Neaspec
- MSA System
- Schaefer Technologie GmbH
Ubytování
Pro ubytování doporučujeme přímo Hotel Lednice. Účastníci si zamlouvají
a platí ubytování sami. V této souvislosti bychom proto rádi upozornili, že kapacita hotelu je omezená.
V Lednici je nicméně množství dalších možností ubytování, vizte např. stránky Lednice
Registrace
Registrace byla ukončena.
Sborník abstraktů
Ke stažení v PDF na http://nanometrologie.cz/sbornik_2019.pdf
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