SPM workshop 2017
We coridally invite you to the next bi-annual SPM workshop that will take place between
29th and 31st March 2017 at Hotel Lednice, just in front of the
Unesco national heritage monument Lednice castle.
Workshop is organized by Department of nanometrology and technical length, Czech Metrology Institute.
The main aim of the workshop is to give an opportunity to meet with all the colleagues
working on SPM fields in Central European region, share results and discuss the novel research topics.
Registration: Wed, 13:00 – 14:00
Opening: Wed, 14:00 – 14:10
|Wed 14:10 – 14:50
||Aspects of metrological atomic force microscopy
|Wed 14:50 – 15:10
||Towards magnetic force microscopy traceability
|Wed 15:10 – 15:30
||Correlative Probe and Electron Microscopy (CPEM) with SPM LiteScope, NenoVision
|Wed 15:30 – 15:50
||Měřicí technika Morava s.r.o. company presentation
|Wed 15:50 – 16:10
|Wed 16:10 – 16:50
||Nano-FTIR spectroscopy at the Metrology Light Source (MLS)
|Wed 16:50 – 17:10
||nano-FTIR - imaging and spectroscopy at 10nm spatial resolution
|Wed 17:10 – 17:30
||Scanning near-field infrared microscopy for investigation of hydrogenated single-wall carbon nanotubes
|Wed 17:30 – 17:50
||Multi-Modal Raman-AFM Imaging
|Wed 17:50 – 18:10
||New Tools for SPM in UHV, High Vacuum, Liquid or Ambient Environments
|Wed 19:00 – 20:00
|Thu 9:00 – 9:20
||Use of AFM for nanomechanical mapping of living cells, biomolecules and biomaterials
|Thu 9:20 – 9:40
||Single-cell force spectroscopy measurement of cell adhesion to cyclopropylamine plasma polymer films
|Thu 9:40 – 10:00
||Optical Tweezers combined with Atomic Force Microscopy - the next level force tool for bio applications
|Thu 10:00 – 10:20
|Thu 10:20 – 10:40
|Thu 10:40 – 11:20
||Radio-frequency scanning tunneling microscopy on molecular and atomic resonators
|Thu 11:20 – 11:40
||Principles and simulations of high-resolution STM imaging with a flexible tip apex.
|Thu 11:40 – 12:00
||High-resolution AFM/STM imaging and spectroscopy of Van der Waals interaction of CO on a Ag(111) metal surface
|Thu 12:00 – 12:20
||Měřicí technika Morava s.r.o. company presentation
|Thu 12:20 – 14:00
|Thu 14:00 – 14:20
||Molecular self-assembly controlled by the electric field of an STM tip
|Thu 14:20 – 14:40
||Control of multiple electron charge states within a single molecule
|Thu 14:40 – 15:00
||Resolving molecular products of astro-photochemistry: light-induced hydrogenation of 1,2-bis(2-phenylethynyl)benzene
|Thu 15:00 – 15:20
||Bruno de la Torre
||Simultaneous high-resolution AFM/STM/IETS imaging of FePc on Au(111)
|Thu 15:20 – 15:40
||Electrostatic properties of CO functionalized tips
|Thu 15:40 – 16:00
||Real-space visualization of the pair correlation function in a 2D molecular gas
|Thu 16:00 – 16:20
|Thu 16:20 – 17:00
||Scanning Thermal Microscope Probes for Accurate Thermometry
|Thu 17:00 – 17:20
||Fast simulation of roughness artefacts in Scanning Thermal Microscopy
|Thu 17:20 – 17:40
||Ballistic and Diffusive Heat Transport in Scanning Thermal Microscopy
|Thu 17:40 – 18:00
||MSA System – A Closer Look At nanotechnology
|Thu 18:00 – 18:05
||RMI company presentation
|Thu 18:05 – 18:20
||NT-MDT New developments in scanning probe microscopy and tip enhanced microscopies
|Thu 19:00 – 23:00
|Fri 9:30 – 10:10
||Nanometrology using piezoresitive scanning probe microscopy cantilevers
|Fri 10:10 – 10:30
||Investigation of shunt propagation in radial junction solar cells with c-AFM
|Fri 10:30 – 10:50
||Characterization of wide bandgap semiconductors by scanning probe microscopies
|Fri 10:50 – 11:10
||Converse piezoelectric effect in structural analogs of helicene
|Fri 11:10 – 11:30
|Fri 11:30 – 11:50
||Optimisation of process conditions of layers and structures for hybrid organic - inorganic photonics.
|Fri 11:50 – 12:10
||Anna Charvátová Campbell
||Correction of nanoindentations data based on AFM surface topography measurements
|Fri 12:10 – 12:30
||Open SPM data sources from space missions
|Fri 12:30 – 12:50
||Macromodel of AFM / SPM
|Fri 12:50 – 13:10
||Complex nano-patterning of amorphous silicon thin films by scanning probe
||End of the workshop, lunch
- Novel SPM modes and devices
- UHV STM and AFM
- SPM applications for different physical quantities
- Instrumentation development and metrology
- SPM data processing
Preliminary list of invited speakers
- Bernd Kästner, Physikalisch Technische Bundesanstalt, Germany, "Nano-FTIR spectroscopy at the Metrology Light Source"
- Andrew Yacoot, National Physical Laboratory, United Kingdom, "Aspects of metrological atomic force microscopy"
- Stefan Müllegger, Johannes Kepler University Linz, Austria, "Radio-frequency scanning tunneling microscopy on molecular and atomic resonators"
- Theodor Gotszalk, Wroclaw University of Technology, Poland, "Nanometrology using piezoresitive scanning probe microscopy cantilevers"
- Jonathan Weaver, University of Glasgow, United Kingdom, "Scanning Thermal Microscope Probes for Accurate Thermometry"
Sponsors and exhibitors
- MT-M (main sponzor), representing Bruker, SPECS
- Nicolet CZ, representing Neaspec
- RMI (NT–MDT)
- Schaefer Technologie GmbH, representing AFMWorkshop, Cytosurge, Park Systems, and RHK Technology
- Uni-Export Instruments, representing Witec
- JPK Instruments
- MSA System
For accomodation we recommend Hotel Lednice. We expect participants
to book and pay the accomodation by themselves. Please note that the capacity of the hotel is limited (first come, first serve).
Another accomodation possibilies in Lednice are listed on Lednice pages.
Even if Lednice is a small town, there are plenty of possibilities within walking distance from the workshop venue.
Workshop fee is 44 Euro and covers all the costs except accomodation.
Registration is done via CMI's website.
We would like to ask our czech colleagues to use the czech form for the registration which is avalilable here.
Registration deadline was extended to 9th March 2017.