Research topics

There are many directions in the field of nanometrology that we could take and a small research group certainly cannot address all of them. We try to concentrate on quantitative methods in scanning probe microscopy and related methods, focusing on integration of measurement and numerical analysis methods.

Even if most of the research is project based, we are trying to head all the particular research topics towards a complex set of methodology for SPM based nanometrology, hoping that the results could be used also by other researchers. From the main research directions we can select the following:


(c) CMI 2012

News

We invite you to our SPM workshop.

Image of the month


Atomic steps on Si

Contact

Department of nanometrology and technical length
Czech Metrology Institute
Okružní 31, 638 00 Brno
pklapetek(at)cmi.cz