Books

P. Klapetek et al.Quantitative Data Processing in Scanning Probe Microscopy, Elsevier, 368 pages, ISBN: 9781455730582 (2012)

Book covers basics of instrumentation, data processing, artifacts and modeling in the fields of local dimensional, mechanical, electrical, magnetic, thermal and optical measurements using Scanning Probe Microscopy techniques (AFM, STM, EFM, MFM, SThM, SNOM, etc.).

Journal articles

2017

  • P. Klapetek, J. Martinek, P. Grolich, M. Valtr, N. J. Kaur, Graphics cards based topography artefacts simulations in Scanning Thermal Microscopy, International Journal of Heat and Mass Transfer 108 (2017) 841–850

    2016

  • P. Stadler, D. Farka, H. Coskun, E. D. Glowacki, C. Yumusak, L. M. Uiberlacker, S. Hild, L. N. Leonat, M. C. Scharber, P. Klapetek, R. Menon, N. S. Sariciftci, Local order drives the metallic state in PEDOT:PSS, Journal of Material Chemistry C 4 (2016) 6982-6987
  • A. Sikora, A. Rodak, O. Unold, P. Klapetek, The development of the spatially correlated adjustment wavelet filter for atomic force microscopy data, Ultramicroscopy 171 (2016) 146-152
  • A. C. Campbell, P. Jelínek, P. Klapetek, Study of uncertainties of height measurements of monoatomic steps on Si 5 × 5 using DFT, NanoScale 2016
  • D. Nečas, P. Klapetek, Study of user influence in routine SPM data processing, NanoScale 2016
  • P. Klapetek, A. Yacoot, P. Grolich, M. Valtr, D. Nečas, Gwyscan: a library to support non-equidistant scanning probe microscope measurements, NanoScale 2016

    2015

  • P. Klapetek, M. Valtr, L. Picco, O. D. Payton, J. Martinek, A. Yacoot, M. Miles, Large area high-speed metrology SPM system, Nanotechnology 26 (2015)
  • A. Fejfar, M. Hývl, A. Vetushka, P. Pikna, Z. Hájková, M. Ledinský, J. Kočka, P. Klapetek, A. Marek, A. Mašková, J. Vyskočil, J. Merkel, C. Becker, T. Itoh, S. Misra, M. Foldyna, LW. Yu, P. R. I Cabarrocas, Correlative microscopy of radial junction nanowire solar cells using nanoindent position markers, Solar Energy Materials and Solar Cells 135 (2015) 106-112
  • J. Martinek, P. Klapetek, A. C. Campbell, Methods for topography artifacts compensation in scanning thermal microscopy, Ultramicroscopy 155 (2015) 55-61

    2014

  • J. Lazar, P. Klapetek, M. Valtr, J. Hrabina, Z. Buchta, O. Číp, M. Čížek, J. Oulehla, M. Šerý, Short-Range Six-Axis Interferometer Controlled Positioning for Scanning Probe Microscopy, Sensors 14 (2014) 877-886
  • J. Man, A. Weidner, P. Klapetek, J. Polák, Slip activity of persistent slip bands in early stages of fatigue life of austenitic 316L steel, Materials Structure & Micromechanics of Fracture VII 592-593 (2014) 785-788
  • J. Hrabina, J. Lazar, P. Klapetek, M. Valtr, O. Číp, J. Oulehla, M. Čížek, M. Holá, M. Šerý, 6-axis interferometric coordinates measurement system for nanometrology, Photonic Instrumentation Engineering 8992 (2014)
  • J. Hrabina, J. Lazar, P. Klapetek, O. Číp, M. Čížek, M. Holá, M. Šerý, Interferometric coordinates measurement system for local probe microscopy nanometrology, Nanocon 2013, 5th International Conference (2014) 797-802
  • J. Martinek, M. Valtr, R. Cimrman, P. Klapetek, Thermal conductivity analysis of delaminated thin films by scanning thermal microscopy, Measurement Science and Technology 25 (2014)
  • P. Klapetek, D. Nečas, Independent analysis of mechanical data from atomic force microscopy, Measurement Science and Technology 25 (2014)
  • A. Rae, R. Stosch, P. Klapetek, A.R.H. Walker, D. Roy, State of the art Raman techniques for biological applications, Methods 68 (2014) 338-347
  • D. Nečas, V. Čudek, J. Vodák, M. Ohlídal, P. Klapetek, J. Benedikt, K. Ruegner, L. Zajíčková, Mapping of properties of thin plasma jet films using imaging spectroscopic reflectometry, Measurement Science and Technology 25 (2014)

    2013

  • D. Nečas, P. Klapetek, One-dimensional autocorrelation and power spectrum density functions of irregular regions, Ultramicroscopy 124 (2013) 13-19
  • J. Hrabina, J. Lazar, P. Klapetek, O. Číp, M. Čížek, M. Šerý, Nanometrology interferometric coordinates measurement system for local probe microscopy, Sixth International Symposium on Precision Mechanical Measurements 8916 (2013)
  • P. Klapetek, L. Picco, O. Payton, A. Yacoot, M. Miles, Error mapping of high-speed AFM systems, Measurement Science and Technology 24 (2013)

    2012

  • P. Klapetek, M. Valtr, V. Duchoň and J. Sobota, Voice coil-based scanning probe microscopy, Nanoscale Research Letters 7 (2012) 332
  • P. Klapetek, M. Valtr, P. Buršík, Non-equidistant scanning approach for millimetre-sized SPM measurements, Nanoscale Research Letters 7 (2012) 213
  • D. Nečas, P. Klapetek, Gwyddion: an open-source software for SPM data analysis, Central European Journal of Physics, 10 (2012) 181-188
  • J. Lazar, J. Hrabina, M. Šerý, P. Klapetek, O. Číp, Multiaxis interferometric displacement measurement for local probe microscopy, Central European Journal of Physics, 10 (2012) 225-231
  • L. Fojt, P. Klapetek, L Strašák, V. Vetterl, Fibrinogen and cellular adherability on differently treated titanium as implants, Central European Journal of Physics, 10 (2012) 232-238

    2011

  • P. Klapetek, L. Koenders, Nanoscale metrology, Meas. Sci. Technol 22 (2011) 090101
  • U. Brand, E. Beckert, A. Beutler, GL. Dai, C. Stelzer, A. Hertwig, P. Klapetek, J. Koglin, R. Thelen, R. Tutsch, Comparison of optical and tactile layer thickness measurements of polymers and metals on silicon or SiO2, Meas. Sci. Technol 22 (2011) 094021
  • A. Campbellová, M. Valtr, J. Zůda, P. Klapetek, Traceable measurements of small forces and local mechanical properties, Meas. Sci. Technol 22 (2011)
  • P. Klapetek, M. Valtr, M. Matula, A long-range scanning probe microscope for automotive reflector optical quality inspection Meas. Sci. Technol 22 (2011) 094011
  • J. Hrabina, J. Lazar, P. Klapetek, O. Číp, Multidimensional interferometric tool for the local probe microscopy nanometrology, Meas. Sci. Technol 22 (2011) 094030
  • P. Klapetek, M. Valtr, D. Nečas, O. Salýk, P. Dzik, Atomic force microscopy analysis of nanoparticles in non-ideal conditions, Nanoscale Research Letters 6 (2011) 514
  • M. Ohlídal, I. Ohlídal, P. Klapetek, D. Nečas, A. Majumdar, Measurement of the thickness distribution and optical constants of non-uniform thin films, Meas. Sci. Technol. 22 (2011) 085104
  • A. Campbellová, M. Ondráček, P. Pou, R. Pérez, P. Klapetek, P. Jelínek, 'Sub-atomic' resolution of non-contact atomic force microscope images induced by a heterogeneous tip structure: a density functional theory study Nanotechnology 22 (2011) 295710
  • A. Campbellová, P. Klapetek, M. Valtr, Uncertainty modeling in nanoscale scanning probe microscopy measurements of fullerene C-60, Meas. Sci. Technol. 22 (2011) 035106
  • P. Klapetek, D. Nečas, A. Campbellová, A. Yacoot, L. Koenders, Methods for determining and processing 3D errors and uncertainties for AFM data analysis Meas. Sci. Technol. 22 (2011) 025501
  • V. Buršíková, O. Bláhová, M. Karásková, L. Zajíčková, O. Jašek, D. Franta, P. Klapetek, J. Buršík, Mechanical properties of ultrananocrystalline thin films deposited using dual frequency discharges, Chemicke listy 105 (2011) S98-S101

    2010

  • P. Klapetek, M. Valtr, A. Poruba, D. Nečas, M. Ohlídal, Rough surface scattering simulations using graphics cards, Appl. Surf. Sci. 256 (2010) 5640-5643
  • P. Klapetek, J. Bujdák, J. Buršík, Near-field scanning optical microscopy local luminescence studies of rhodamine dye, Central European Journal of Physics, 8 (2010) 312-317
  • A. Campbellová, P. Klapetek, V. Buršíková, M. Valtr, J. Buršík, Small-load nanoindentation experiments on metals, Surface and Interface Analysis 6-7 (2010) 766-769
  • P. Klapetek, M. Valtr, Near-field optical microscopy simulations using graphics processing units, Surface and Interface Analysis 6-7 (2010) 1109-1113
  • H. U. Danzebrink, L. Koenders, G. B. Picotto, A. Lasilla, S.H.H. Wang, P. Klapetek, Final report on EUROMET.L-S15.a (EUROMET Project 925): Intercomparison on step height standards and 1D gratings, Metrologia 47 (2010) DOI: 10.1088/0026-1394/47/1A/04006

    2009

  • Miloslav Ohlídal, Ivan Ohlídal, Petr Klapetek, David Nečas, Vilma Buršíková, Application of spectroscopic imaging reflectometry to analysis of area non-uniformity in diamond-like carbon films, Diamond and Related Materials, Volume 18, Issues 2-3, February-March 2009, Pages 384-387
  • J. Lazar, P. Klapetek, O. Číp, M. Čížek, M. Šerý, Local probe microscopy with interferometric monitoring of the stage nanopositioning, Meas. Sci. Technol., 20, 084007
  • A. Campbellová, P. Klapetek, M. Valtr, Tip-sample relaxation as a source of uncertainty in nanoscale scanning probe microscopy measurements, Meas. Sci. Technol. 20 084014
  • Lukáš Fojt, Petr Klapetek, Luděk Strašák, Vladimír Vetterl, 50 Hz magnetic field effect on the morphology of bacteria, Micron, Volume 40, Issue 8, December 2009
  • J. Man, P. Klapetek, O. Man, A. Weidner, K. Obrtlík, J. Polák, Extrusions and intrusions in fatigued metals. Part 2. AFM and EBSD study of the early growth of extrusions and intrusions in 316L steel fatigued at room temperature Philosophical Magazine, Volume 89, 16, 2009, 1337 - 1372
  • 2008

  • J. Orava, T. Wagner, M. Krbal, T. Kohoutek, Mil. Vlcek, P. Klapetek and M. Frumar, Selective dissolution of Agx(As0.33S0.67?ySey)100?x chalcogenide thin films Journal of Non-Crystalline Solids, Volume 354, Issues 2-9, 15 January 2008, Pages 533-539
  • J. Zemek, K. Olejnik, P. Klapetek, Photoelectron spectroscopy from randomly corrugated surfaces, Surface Science, Volume 602, Issue 7, 1 April 2008, Pages 1440-1446
  • Petr Klapetek, Jiří Buršík,Near-field scanning optical microscopy studies of thin film surfaces and interfaces, Applied Surface Science, Volume 254, Issue 12, 15 April 2008, Pages 3681-3684
  • Petr Klapetek, Jiří Buršík, Miroslav Valtr, Jan Martinek, Near-field scanning optical microscope probe analysis, Ultramicroscopy, Volume 108, Issue 7, June 2008, Pages 671-676
  • Daniel Franta, Lenka Zajíčková, Monika Karásková, Ondřej Jašek, David Nečas, Petr Klapetek, Miroslav Valtr, Optical characterization of ultrananocrystalline diamond films, Diamond and Related Materials, Volume 17, Issues 7-10, July-October 2008, Pages 1278-1282
  • A. Weidner, J. Man, W. Tirschler, P. Klapetek, C. Blochwitz, J. Polák, W. Skrotzki,Half-cycle slip activity of persistent slip bands at different stages of fatigue life of polycrystalline nickel, Materials Science and Engineering: A, Volume 492, Issues 1-2, 25 September 2008, Pages 118-127
  • 2007

  • D. Franta, I. Ohlídal, P. Klapetek, R. Nepustilová, S. Bajer, Characterization of polymer thin films deposited on aluminum films by the combined optical method and atomic force microscopy. Surface and Interface Analysis, USA : John Wiley & Sons, 38, 4, od s. 842-846
  • L. Zajíčková, Z. Kučerová, D. Franta, V. Buršíková, J. Buršík, P. Sťahel, P. Klapetek, Plasma enhanced CVD of thin films using hexamethyldisiloxane and octamethyltetrasiloxane monomers. In 18th International Symposium on Plasma Chemistry. Kyoto : International Plasma Chemistry Society, 2007. s. 459-459
  • V. Buršíková, P. Dvořák, L. Zajíčková, D. Franta, J. Janča, J. Buršík, J. Sobota, P. Klapetek, V. Peřina, Deposition and Characterization of Nanostructured Silicon-Oxide Containing Diamond-Like Carbon Coatings Optoelectronics and Advanced Materials - Rapid Communications, Bucharest : INOE & INFM, 1, 10, od s. 491-495, 5 s. 2007
  • J. Dušek, V. Buršíková, V. Navrátil, J. Buršík, O. Bláhová, P. Klapetek, Comparative study on several micro and nanoindentation techniques including AFM NANO ´06. Brno : University of Technology, Faculty of Mechanical Engineering and COMTES FHT, Ltd., Plzeň, 2007. od s. 30-30, 1 s. ISBN 80-214-3331-0.
  • P. Klapetek, J. Buršík, Artefakty v rastrovací optické mikroskopii v blízkém poli Jemná mechanika a optika, 10 (2007), 279
  • P. Klapetek, I. Ohlídal, J. Buršík, Atomic force microscopy studies of cross-sections of columnar thin films Meas. Sci. Technol. 18, 2 (2007)
  • M. Valtr, P. Klapetek, I. Ohlídal, D. Franta, UV light enhanced oxidation of a-C:H thin film in air. A study of thickness reduction Optoelectronics and Advanced Materials ? Rapid Communications Vol. 1, No. 11, November 2007, p. 620 - 624
  • M. Valtr, P. Klapetek, I. Ohlídal, V. Duchoň, Study of thickness reduction of a-C:H thin film under UV light irradiation 28th ICPIG, July 15-20, 2007, Prague, Czech Republic
  • Petr Klapetek and Jiří Buršík, Near-field scanning optical microscopy studies of thin film surfaces and interfaces Applied Surface Science, In Press, Corrected Proof, Available online 9 November 2007
  • Petr Klapetek, Jiří Buršík, Miroslav Valtr and Jan Martinek, Near-field scanning optical microscope probe analysis Ultramicroscopy, In Press, Uncorrected Proof, Available online 12 November 2007
  • Petr Klapetek, Tomáš Wágner and Jiří Orava, Electromagnetic field distribution modelling in microlenses fabrication process Journal of Physics and Chemistry of Solids, Volume 68, Issues 5-6, May-June 2007, Pages 887-890
  • J. Orava, T. Wágner, M. Krbal, T. Kohoutek, M. Vlček, L. Beneš, E. Kotulanová, P. Bezdička, P. Klapetek and M. Frumar, Selective wet-etching of amorphous/crystallized Ag-As-S and Ag-As-S-Se chalcogenide thin films, Journal of Physics and Chemistry of Solids, Volume 68, Issues 5-6, May-June 2007, Pages 1008-1013
  • 2006

  • V. Buršíková, L. Zajíčková, D. Franta, J. Janča, J. Buršík, P. Klapetek, O. Bláhová, V. Peřina, V. Navrátil, Deposition and Characterisation of Nanostructured silicon-oxide Containing Diamond-like Carbon Coatings. In 7th International Balkan Workshop on Applied Physics - Abstracts. 1. vyd. Constanta, Romania : Ovidius University, 2006. od s. 101-102, 1 s. ISBN 973-614-313-7
  • P. Klapetek, I. Ohlídal, J. Buršík, Applications of scanning thermal microscopy in the analysis of the geometry of patterned structures Surface and Interface Analysis, 38 (2006) 383
  • 2005

  • Petr Klapetek, Ivan Ohlídal, Jindřich Bílek, Atomic force microscope tip influence on the fractal and multi-fractal analyses of the properties of randomly rough surfaces Nanoscale Calibration Standards and Methods, ed. by G. Wilkening and L Koenders, Wiley VCH, p. 452, 2005
  • Petr Klapetek, Ivan Ohlídal, A. Montaigne Ramil, A. Bonnanni and H. Sitter, Atomic force microscopy analysis of morphology of the upper boundaries of GaN thin films prepared by MOCVD Vacuum, 2005, Volume 80
  • Vilma Buršíková, Petr Klapetek, Angelique Bousquet, Marek Eliáš, Study of the mechanical properties of thin films using combined nanoindentation and AFM measurements Jemná mechanika a optika, 11_12, 323-326, 2005
  • Miroslav Valtr, Ivan Ohlídal, Petr Klapetek, AFM Study of Hydrocarbon Thin Films In WDS'05 Proceedings of Contributed Papers - Part II - Physics of Plasmas and Ionized Media (ed. J. Safrankova). Praha - Matfyzpress, 2005. 391-396
  • Ivan Ohlídal, Miloslav Ohlídal, Daniel Miloslav, Vlastimil Čudek, Vilma Buršíková, Petr Klapetek, Kateřina Páleníčková, Influence of technological conditions on mechanical stresses inside diamond-like carbon films Diamond and Related Materials, 14, 11-12, 1835-1838, 2005
  • Ohlídal I., Ohlídal M., Franta D., Čudek V., Buršíková V., Klapetek P., Jákl M.., Optical measurement of mechanical stresses in diamond-like carbon films Proceedings of 8-th International Symposium on Laser Metrology, SPIE 5776, 2005, 717-728
  • P. Klapetek, I. Ohlídal, Application of the wavelet transformation in AFM data analysis Acta Physica Slovaca, 55 (2005) 295
  • I. Ohlídal, D. Franta, P. Klapetek, Combination of optical methods and atomic force microscopy at characterization of thin film systems Acta Physica Slovaca, 55 (2005) 271
  • P. Klapetek, I. Ohlídal, J. Buršík, Scanning thermal microscopy - theory and applications Jemná mechanika a optika, 11-12 (2005) 327
  • R. Antoš, I. Ohlídal, D. Franta, P. Klapetek, J. Mistík, T. Yamaguchi, S. Višňovský, Spectroscopic ellipsometry of sinusoidal surface-relief gratings Applied Surface Science, 244 (2005) 221
  • 2004

  • Daniel Franta, Ivan Ohlídal, Petr Klapetek, Alberto Montaigne-Ramil, Alberta Bonanni, David Stifter, Helmut Sitter, Optical properties of ZnTe films prepared by molecular beam epitaxy Thin Solid Films, 468, 1-2, 193-202, 2004
  • Petr Klapetek, Ivan Ohlídal, Jindřich Bílek, Influence of the atomic force microscope tip on the multifractal analysis ofrough surfaces Ultramicroscopy, 102, 1, 51-59, 2004
  • Daniel Franta, Ivan Ohlídal, Petr Klapetek, Miloslav Ohlídal, Characterization of thin oxide films on GaAs substrates by optical methods and atomic force microscopy Surface and Interface Analysis, 36, 8, 1203-1206, 2004
  • Daniel Franta, Ivan Ohlídal, Petr Klapetek, Pere Roca i Cabarrocas, Complete Characterization of Rough Polymorphous Silicon Films by Atomic Force Microscopy and the Combined Method of Spectroscopic Ellipsometry and Spectroscopic Reflectometry Thin Solid Films, 455-456, 1, 399-403, 2004
  • Petr Klapetek, Ivan Ohlídal, Karel Navrátil, Atomic Force Microscopy Analysis of Statistical Roughness of GaAs Surfaces Originated by Thermal Oxidation Microchimica Acta, 147, 3, 175-180, 2004
  • 2003

  • Ivan Ohlídal, Petr Klapetek, Daniel Franta: Aplikace mikroskopie atomové síly při analýze tenkých vrstev ZnSe a ZnTe, Československý časopis pro fyziku, 2 (97-100), Praha, 2003.
  • Petr Klapetek, Ivan Ohlídal, Daniel Franta, Alberto Montaigne-Ramil, Alberta Bonanni, David Stifter, Helmut Sitter: Atomic force microscopy characterization of ZnTe epitaxial films, Acta Physica Slovaca, 3 (223-230), Bratislava, 2003.
  • Petr Klapetek, Ivan Ohlídal, Alberto Montaigne-Ramil, Alberta Bonanni, David Stifter, Helmut Sitter: Atomic force microscopy characterization of ZnTe epitaxial thin films, Japanese Journal of Applied Physics, 42 (4706-4709), Tokyo, 2003.
  • Zdeněk Frgala, Vít Kudrle, Jan Janča, Vilma Buršíková, Petr Vašina, Marcel Meško, Jiří Buršík, M. Kadlečíková, Petr Klapetek: Diamond Growth on silicon and WC-Co by microwave plasma chemical vapor deposition, Proceedings of contributed papers WDS'03, (341-346), Praha, 2003.
  • Vilma Buršíková, Pavel Dvořák, Lenka Zajíčková, Petr Klapetek, Jiří Buršík, Jan Janča: Effect of the Discharge Conditions on the Mechanical Properties of the Plasma Deposited DLC:SiOx Films, Proceedings of SAPP XIV., (197-198), Bratislava, 2003.
  • Martin Šiler, Ivan Ohlídal, Petr Klapetek: Mikroskopie magnetické síly: Aplikace při studiu pevných disků. Československý časopis pro fyziku, 54, (124-127), Praha, 2003.
  • Miloslav Ohlídal, Ivan Ohlídal, Petr Klapetek, Miloš Jákl, Vladimír Čudek, Marek Eliáš: New Method for the Complete Optical Analysis of Thin Films Nonuniform in Optical Parameters, Japanese Journal of Applied Physics, 42, (4760-4765), Tokyo, 2003.
  • Daniel Franta, Ivan Ohlídal, Petr Klapetek, Alberto Montaigne-Ramil, Alberta Bonanni, David Stifter, Helmut Sitter: Optical constants of ZnTe and ZnSe epitaxial thin films, Acta Physica Slovaca, 2, (95-104), Bratislava, 2003.
  • Daniel Franta, Ivan Ohlídal, Petr Klapetek, Alberto Montaigne-Ramil, Alberta Bonanni, David Stifter, Helmut Sitter: Optical characterization of ZnSe thin films, 19th Congress of the International Commission for Optics: Optics for the Quality of Life., (831-832), Bellingham, 2003.
  • Petr Klapetek, Ivan Ohlídal: Srovnání snímků NSOM a AFM při studiu vybraných objektů, Československý časopis pro fyziku, 6-7s, (79-81), Praha, 2003.
  • Petr Klapetek, Ivan Ohlídal: Theoretical analysis of the atomic force microscopy characterization of columnar thin films, Ultramicroscopy, 94, (19-29), Amsterdam, 2003.
  • 2002

  • Petr Klapetek, Ivan Ohlídal, Daniel Franta, Pavel Pokorný: Analysis of the boundaries of ZrO2 and HfO2 thin films by atomic force microscopy and the combined optical method Surface and Interface Analysis, 34, (559-564), 2002.
  • Martin Šiler, Petr Klapetek, Ivan Ohlídal: Aplikace mikroskopie magnetické síly při studiu záznamového prostředí pevných disků, Jemná mechanika a optika, 47, (216-219), Přerov, 2002.
  • Petr Klapetek, Ivan Ohlídal, Daniel Franta: Applications of atomic force microscopy for thin film boundary measurements, Jemná mechanika a optika, 47, (195-199), Přerov, 2002.
  • Daniel Franta, Ivan Ohlídal, Petr Klapetek, Pavel Pokorný: Characterization of the boundaries of thin films of TiO2 by atomic force microscopy and optical methods, Surface and Interface Analysis, 34, (759-762), 2002.
  • Daniel Franta, Ivan Ohlídal, Petr Klapetek, Alberto Montaigne-Ramil, Alberta Bonanni, David Stifter, Helmut Sitter: Influence of overlayers on determination of the optical constants of ZnSe thin films, Journal of Applied Physics, 92, (1873-1880), 2002.
  • 2001

  • Daniel Franta, Ivan Ohlídal, Petr Klapetek, Pavel Pokorný, Miloslav Ohlídal: Analysis of inhomogeneous thin films of ZrO2 by the combined optical method and atomic force microscopy, Surface and Interface Analysis, 32, (91-94), 2001.
  • Ivan Ohlídal, Daniel Franta, Petr Klapetek: Měření základních statistických veličin náhodné povrchové drsnosti pomocí mikroskopie atomové síly, Československý časopis pro fyziku, 1, (16-21), Praha, 2001.
  • Marek Eliáš, Vilma Buršíková, Lenka Zajíčková, Vít Kudrle, Petr Klapetek, Jan Janča: Preparation of enhanced CN-based hard coatings by PECVD, Proceedings of 15th International Symposium on Plasma Chemistry, (1913-1918), Orleans, 2001.
  • Petr Klapetek, Daniel Franta, Ivan Ohlídal: Study of Thin Film Defects by Atomic Force Microscopy, Proceedings of the 4th Seminar on Quantitative Microscopy and 1st Seminar on Nanoscale Calibration Standards and Methods, (107-117), Braunschweig, 2001.
  • Petr Klapetek, Ivan Ohlídal, Daniel Franta: Vliv diskrétní Fourierovy transformace na zpracování AFM dat, Československý časopis pro fyziku, 1, (49-51), Praha, 2001.
  • 2000

  • Daniel Franta, Ivan Ohlídal, Petr Klapetek: Analysis of Slightly Rough Thin Films by Optical Methods and AFM, Mikrochim. Acta, 132, (443-447), Wien, 2000.
  • Ivan Ohlídal, Daniel Franta, Petr Klapetek: Atomic force microscopy measurements of surface roughness quantities important in optics of surfaces and thin films, Proceedings of the 4th Seminar on Quantitative Microscopy, (124-131), Braunscheig, 2000.
  • 1999

  • Ivan Ohlídal, Daniel Franta, Petr Klapetek, Martin Vičar: Relationship Between AFM and Optical Measurements at Analyzing Surface Roughness, Jemná mechanika a optika, 44, (307-311), Přerov, 1999.
  • 1998

  • Ivan Ohlídal, Daniel Franta, Martin Vičar, Petr Klapetek: Comparison of AFM and optical methods at measuring nanometric surface roughness Proceedings of the 3th Seminar on Quantitative Microscopy, (123-129), Braunschweig, 1998.

  • (c) CMI 2012

    News

    We invite you to our SPM workshop.

    Image of the month


    Atomic steps on Si

    Contact

    Department of nanometrology and technical length
    Czech Metrology Institute
    Okružní 31, 638 00 Brno
    pklapetek(at)cmi.cz